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VOLUME 47 (1988) | ISSUE 3 | PAGE 154
Determination of the valence-electron component of the atomic scattering factor of silicon by means of a Compton effect excited by an x-ray standing wave
A new approach for studying coherent Compton scattering has been implemented for the first time. The idea is to detect the Compton scattering under conditions corresponding to dynamic Laue diffraction of χ rays. The way in which the angular dependence of the Compton scattering is shaped has been studied. The component of the atomic scattering factor of silicon, which is due to valence electrons, has been found experimentally.