Home
For authors
Submission status

Current
Archive
Archive (English)
   Volumes 21-40
   Volumes 1-20
   Volumes 41-62
      Volume 62
      Volume 61
      Volume 60
      Volume 59
      Volume 58
      Volume 57
      Volume 56
      Volume 55
      Volume 54
      Volume 53
      Volume 52
      Volume 51
      Volume 50
      Volume 49
      Volume 48
      Volume 47
      Volume 46
      Volume 45
      Volume 44
      Volume 43
      Volume 42
      Volume 41
Search
VOLUME 48 (1988) | ISSUE 5 | PAGE 247
Submillimeter photoconductivity in inversion layers at a silicon surface
A fast submillimeter photoconductivity has been detected in inversion layers at the Si surface. Because of the short photoresponse time ( < 40 ns) and the common properties of the resonant and nonresonant photoconductivities, this effect can be linked with the heating of a two-dimensional electron gas.