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VOLUME 49 (1989) | ISSUE 8 | PAGE 434
Quantization of rotation of the polarization plane of light reflected from the surface layer of a semiconductor
Quantization of the angle of rotation of the polarization plane of the reflected light as a function of the wavelength of the incident light in the surface layer of a cubic crystal of CdTe has been observed for the first time. This phenomenon was instrumental in detecting single quantum-size subbands of heavy and light holes in the inversion layer of я-type CdTe.