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VOLUME 53 (1991) | ISSUE 1 | PAGE 51
Observation of anomalies in the spectrum and angular distribution of the γ-ray emission by ultrarelativistic electrons in thick crystals
A new method has made it possible to measure the true spectrum and angular distribution of the y-ray emission by high-energy electrons in thick crystals for the first time. Anomalies have been observed in the angular distribution of the hard γ emission during passage of an electron beam along a crystallographic axis through a silicon crystal.