Single-particle tunneling through an EuS barrier
Borukhovich A. S., Sukhov V. A.
The differential current-voltage characteristics of the tunnel structure NbN-EuS-Pb were found to contain features that are associated with the existence of nonadditive components of single-particle tunneling through a ferromagnetic semiconductor barrier. These features could be caused by the phonon generation at the semiconductor-(ferromagnetic semiconductor) boundary.