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VOLUME 54 (1991) | ISSUE 1 | PAGE 52
Influence of proximity effect on the current-voltage characteristics of Bi-Sr-Ca-Cu-O:Pb break junctions
A study has been made of the current-voltage characteristics of break junctions in BiSrCaCuO-Pb samples containing 2-2-1-2 and 2-2-2-3 phase intergrowths. The current-voltage characteristics of these break junctions have a region in which the current rises vertically, at Vg = ± 2Δ/e. They also have the knee typical of Sx-S2-I-S2-Si tunnel structures. The temperature dependence of the gap parameter Δ of these samples indicates a strong proximity effect.