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VOLUME 62 (1995) | ISSUE 6 | PAGE 483
Temperature dependence of the resistivity and structure of carbon nanotube films containing various kinds of tubules
The temperature dependence of the resistivity is measured over a range of 4.2 to 300 К on carbon films containing multilayer nanotubes (MLTs) or single-layer nanotubes (SLTs) oriented perpendicular to the substrate. The structure of these films is examined by high-resolution electron microscopy. At low temperatures, the planar resistivity of all the films is well fit by the expression In p°c [T0IT\lin, with л = 4 and TQ~ ΙΟ6 К for the MLT films but with η = 2 and Γ0~20 К for the films containing bundles of SLTs 0.71 nm in diameter. The data obtained are considered in terms of the variable-range hopping conductivity. The estimations made show a fairly high density of states at the Fermi level (~1021 eV_1cnT3) for the films containing SLTs. © 1995 American Institute of Physics.