Photodesorption of metal ions in a semiconductor-water system
Beklemyshev V. I. , Makarov V. V. , Makhonin I.I., Petrov Yu. N. , Prokhorov A. M. , Pustovoi V. I.
The effect of a low-intensity laser beam on the desorption of metal ions from the surface of a semiconductor has been studied. The results reveal an increase in the desorption of potassium ions from a silicon surface during illumination by an argon laser at an intensity of 100 m W/cm2.