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VOLUME 45 (1987) | ISSUE 3 | PAGE 132
Scattering of polaritons by fluctuations of the dielectric constant in thin films
The scattering of polaritons by fluctuations of the dielectric constant € due to a change in the structure of the electron spectrum upon small changes in the thickness of the film is analyzed. Near exciton lines, the fluctuations in € are more important than direct scattering by irregularities of the film boundaries.