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VOLUME 45 (1987) | ISSUE 9 | PAGE 434
Electron spin resonance of the intrinsic defects in TlSe crystals
The electron spin resonance of undoped thallium selenide in the temperature interval 3.8-8.2 К is described and the temperature dependence of the paramagnetic relaxation rate is determined. Analysis of the allowed superhyperfine structure and the large hyperfine structure constant suggest that the model for the intrinsic defect of the TISe structure can be used.