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VOLUME 39 (1984) | ISSUE 1 | PAGE 3
Angstrom-level resolution in x-ray-diffraction study of crystal surface structure
It is possible to analyze the structure of extremely thin surface layers of a crystal, with thicknesses on the order of a few interatomic distances. The structure of the surface of a germanium crystal under a film (~ 1 μπι thick) of another material has been studied for the first time.