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VOLUME 54 (1991) | ISSUE 9 | PAGE 510
Relationship between 1/f noise and nonlinearity effects in metal films
A relationship has been found between the \/f noise and the cubic nonlinearity of the current-voltage characteristic in unbroken metal films. In films with a high concentration of mobile defects, the \/f noise and the nonlinearity effects arise from a conductivity modulation due to the creation and annihilation of vacancies.