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VOLUME 56 (1992) | ISSUE 1 | PAGE 31
Current noise in thin polymer films near an insulator-metal transition
Current fluctuations near an insulator-metal transition in thin polymer films have been studied. The measured spectral density of the current noise is described by S(o)) α:Αω ~ r, where y< 1. The critical growth of the mean square fluctuation, (SU2) <x exp (a U), is the reason why there are no clearly defined thresholds for the transition process. This process appears to be probabilistic.