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VOLUME 60 (1994) | ISSUE 4 | PAGE 285
Amplitude of the atomic corrugation of a cleaved bismuth surface measured with a scanning tunneling microscope
The amplitude of the atomic corrugation, A, and the change in the gap between the sample and the scanning tip, <5Z, have been measured as a function of the voltage across the tunneling gap at a fixed current, i.e., as a function of the resistance of the tunneling gap, RT, by scanning tunneling microscopy. The results show that Л increases slightly, from 0.5±0.1 to 0.7±0.1 A, as RT is raised from 40 to -200 ΜΩ. It then falls off to -0.5 A at RT^\ Gil, provided that the shape of the scanning tip does not change during the measurements. The criterion for a constant tip shape was that the SZ(RT) dependence be the same as that expected for vacuum tunneling at a work function of 4.4 eV. © 1994 American Institute of Physics.