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VOLUME 60 (1994) | ISSUE 10 | PAGE 691
Study of the surface of a LiF:F-2 crystal at a subwave spatial resolution
Photoelectron images of the end of the tip of a field-emission microscope at a magnification ~3X104 have been obtained by illuminating the tip, made of a LiF.'Fj crystal, with the beam from an argon laser. The images found during illumination at different laser wavelengths are quite different. It can thus be asserted that a new method for studying surfaces has been realized: chemically selective projection photoelectron microscopy. The images found are analyzed in connection with results on the selective external laser photoelectric effect in LiF.Fj and other insulating crystals. © 1995 American Institute of Physics.