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VOLUME 30 (1979) | ISSUE 4 | PAGE 244
Polaritons in thin semiconducting films
It is shown that the oscillator strengths of the excitons in semiconducting films, whose thickness is less than the effective exciton radius and whose dielectric constant is much greater than that of the medium surrounding the film, increase sharply with decreasing thickness of the film. The reflectivity of the film increases in the neighborhood of the excitonic lines and conditions are established for propagation of the electromagnetic waves-polaritons that are localized near the film.