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VOLUME 44 (1986) | ISSUE 4 | PAGE 205
Experimental observation of a half-degree angular interval of x-ray reflection in backscattering (\theta\approx \pi/2) from a high-quality crystal
An increase of three orders of magnitude in the angular width of the reflection interval of a high-quality crystal in backscattering has been observed experimentally. This increase had been predicted previously by Kohra and Matsushita, Brummer et ah, and Caticha and Caticha-Ellis. New x-ray optics elements with a high luminosity might be developed on the basis of this effect.