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VOLUME 44 (1986) | ISSUE 6 | PAGE 285
Study of the Nb-Nb oxide-Pb film structures with a scanning tunneling microscope
The surface of niobium films, which were used previously to produce niobium-based film structures, niobium-niobium oxide-lead, is studied with a scanning tunneling microscope. The results are in good agreement with the observable properties of these structures which contain Josephson and tunnel junctions.