Features of plasma reflection of strongly doped Si(Li)
Vengalis B.Yu., Kastal'skii A.A., Mal'tsev S.B.
A fine structure was observed in the spectra of the plasma reflection in strongly doped Si(Li). This indicates the existence of an electron-ion "condensate" with concentrations 2 χ 1020 and 1 χ 1020 cm-3.