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VOLUME 77 (2003) | ISSUE 2 | PAGE 114
σ and π-band dispersion of graphite from polarized resonant inelastic X-Ray scattering measurements
PACS: 78.70.-g, 71.25.Tn
Abstract
Resonant inelastic X-Ray scattering of highly oriented pyrolytic graphite (HOPG) is observed above the C 1s threshold at different polarization angles. It is shown that combining the polarization and excitation energy dependence of X-Ray emission spectra makes it possible to perform the quantitative band mapping selective to the chemical bonding (σ  and π ).