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VOLUME 22 (1975) | ISSUE 5 | PAGE 271
Determination of the amplitude of surface-atom oscillations by field ion microscopy
A method is proposed for determining the amplitude of the oscillations of surface atoms on jogs of close-packed planes. The amplitude of the oscillations is calculated from the rate of low-temperature evaporation of the metals in strong electric fields; this rate is measured with the aid of a field ion microscope.