Spectral resolution of x rays using diffraction focusing
Indenbom V.L., Suvorov E.V.
A principally new method of investigating x-ray spectra is demonstrated, using the diffraction focusing that occurs in a doubly diffracted beam of a U-shaped ■ ray interferometer. The spectral-line parameters were measured for the Mo К doublet as well as for the ΜοΚβΐ2 doublet that is difficult to resolve with spectrometers of the ordinary type. The spectral width of the Ka lines agrees with the better results obtained with the aid of incomparably more complicated and cumbersome instruments, turns out to be somewhat less than the theoretical
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