For authors
Submission status

Archive (English)
      Volume 117
      Volume 116
      Volume 115
      Volume 114
      Volume 113
      Volume 112
      Volume 111
      Volume 110
      Volume 109
      Volume 108
      Volume 107
      Volume 106
      Volume 105
      Volume 104
      Volume 103
      Volume 102
      Volume 101
      Volume 100
      Volume 99
      Volume 98
      Volume 97
      Volume 96
      Volume 95
      Volume 94
      Volume 93
VOLUME 95 | ISSUE 10 | PAGE 595
Self-trapping of the d-d charge transfer exciton in bulk NiO evidenced by X-ray excited luminescence
Soft X-ray (XUV) excitation did make it possible to avoid the predominant role of the surface effects in luminescence of NiO and revealed a bulk luminescence with a puzzling well isolated doublet of very narrow lines with close energies near 3.3 eV which is assigned to recombination transitions in self-trapped d-d charge transfer (CT) excitons formed by coupled Jahn-Teller Ni+ and Ni3+ centers. The conclusion is supported both by a comparative analysis of the CT luminescence spectra for NiO and solid solutions NixZn1-xO, and by a comprehensive cluster model assignement of different p-d and d-d CT transitions, their relaxation channels. To the best of our knowledge, it is the first observation of the luminescence due to self-trapped d-d CT excitons.