Home
| VOLUME 108 (2018) | ISSUE 1 | PAGE 71 |
|---|
|
Noise insights into electronic transport
S. U. Piatrushaa,b, L. V. Ginzburga,b, E. S. Tikhonova,b, D. V. Shovkuna,b, G. Koblmüllerc, A. V. Bubisa,b,d, A. K. Grebenkob,d, A. G. Nasibulind,e, V. S. Khrapaia,f
aInstitute of Solid State Physics, Russian Academy of Sciences, 142432 Chernogolovka, Russia bMoscow Institute of Physics and Technology, 141700 Dolgoprudny, Russia cWalter Schottky Institut, Physik Department, and Center for Nanotechnology and Nanomaterials, Technische Universität München, 85748 Garching, Germany dSkolkovo Institute of Science and Technology, Moscow, Russia eDepartment of Applied Physics, School of Science, Aalto University, FI-00076 Aalto, Finland fDepartment of Physics, Moscow State University of Education, 119435 Moscow, Russia
Abstract
Typical experimental measurement is set up as a study of the system's response to a stationary external excitation. This approach considers any random fluctuation of the signal as spurious contribution which is to be eliminated via time-averaging or, equivalently, bandwidth reduction. Beyond that lies a conceptually different paradigm - the measurement of the system's spontaneous fluctuations. The goal of this overview article is to demonstrate how current noise measurements bring insight into hidden features of electronic transport in various mesoscopic conductors, ranging from 2D topological insulators to individual carbon nanotubes. |