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| VOLUME 109 (2019) | ISSUE 12 | PAGE 833 |
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Dimension effects in insulating NbTiN disordered films and asymptotic freedom of Cooper pairs
M. V. Burdastyha,b, S. V. Postolovaa,c, I. A. Derbezova, A. V. Gaislera, M. C. Diamantinid, C. A. Trugenbergere, V. M. Vinokurf, A. Yu. Mironova,b
aA. V. Rzhanov Institute of Semiconductor Physics, 630090 Novosibirsk, Russia bNovosibirsk State University, 630090 Novosibirsk, Russia cInstitute for Physics of Microstructures of the Russian Academy of Sciences, 603950 Nizhny Novgorod, Russia dNoise in Physical Systems Laboratory, Istituto Nazionale di Fisica Nucleare and Dipartimento di Fisica e Geologia, University of Perugia, I-06100 Perugia, Italy eSwissScientific Technologies SA, CH-1204 Geneva, Switzerland fMaterials Science Division, Argonne National Laboratory, Argonne, 60637 Illinois, USA
Abstract
We investigate the evolution of the electronic transport in disordered NbTiN films at the insulating side of the superconductor- insulator transition as function of the effective system size along the current direction. We demonstrate that both, the threshold voltage characterizing low -temperature superinsulating phase, and the Berezinsky-Kosterlitz-Thouless criticality of the conductance above the superinsulator critical temperature, vanish upon increasing disorder taking the system far from the disorder-driven superconductor-insulator transition (SIT). We find that decrease of the system's effective size suppresses its insulating and superinsulating properties and that threshold voltage drops linearly with the diminishing system size. We demonstrate that this linear dependence can be used for experimental measurement of the linear tension of the electric string binding Cooper pairs and anti-Cooper pairs in a superinsulator. |