Effects of quantum recoil forces in resistive switching in memristors
O. G. Kharlanov
Lomonosov Moscow State University, Faculty of Physics, 119991 Moscow, Russia
Abstract
Memristive devices, whose resistance can be controlled by
applying a voltage and further retained, are attractive as possible
circuit
elements for neuromorphic computing. This new type of devices poses a
number of both technological and theoretical challenges. Even the
physics of the key process of resistive switching, usually associated
with formation or breakage of conductive filaments in the
memristor, is not completely understood yet. This work proposes a new
resistive switching mechanism, which should be important in the
thin-filament regime and take place due to the back reaction, or recoil,
of quantum charge carriers - independently of the conventional
electrostatically-driven ion migration. Since thinnest conductive
filaments are in question, which are only several atoms thick and allow
for a
quasi-ballistic, quantized conductance, we use a mean-field theory and
the framework of nonequilibrium Green's functions to discuss the
electron recoil effect for a quantum current through a nanofilament on
its geometry and compare it with the transmission probability of charge
carriers. Namely, we first study an analytically tractable toy model of a
1D atomic chain, to qualitatively demonstrate the importance of
the charge-carrier recoil, and further proceed with a realistic
molecular-dynamics simulation of the recoil-driven ion migration along a
copper
filament and the resulting resistive switching. The results obtained are
expected to add to the understanding of resistive switching
mechanisms at the nanoscale and to help downscale high-retention
memristive devices.