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| VOLUME 122 (2025) | ISSUE 7 | PAGE 416 |
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Structure of the hidden interfaces in liquid crystal electro-optical cell studied by X-ray scattering and atomic force microscopy
Y. O. Volkov+*, B. S. Roshchin+, A. D. Nuzhdin+, A. A. Zhukovich-Gordeeva×, E. P. Pozhidaev×, R. V. Gainutdinov+, V. E. Asadchikov+, B. I. Ostrovskii+*
+National Research Center "Kurchatov Institute", 119333 Moscow, Russia *Y. A. Osipyan Institute of Solid State Physics, Russian Academy Sciences, 142432 Chernogolovka, Russia ×P. N. Lebedev Physical Institute, Russian Academy Sciences, 119991 Moscow, Russia
Abstract
The structure of interfacial boundaries in a liquid crystal (LC) cell, composed of sequential layers of a thin-film electrode, an alignment polymer coating, and a ferroelectric LC, was investigated using X-ray scattering and atomic force microscopy. Quantitative parameters describing the structure of transition layers were obtained, along with statistical data on interface roughness and dielectric constant distribution across the film. These data are expected to provide a link between the roughness and anchoring properties of LC materials at interfaces and give an assessment of the structural modifications occurring at each stage of the electro-optical cell assembly. |