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VOLUME 58 (1993) | ISSUE 9 | PAGE 722
Ellipsometric measurement of the superconductive transition in Y÷Á2óu3ï7-δ ab-oriented film at wavelength 119/μ m
We present the first measurements of the temperature dependence of the complex dielectric function €α(,(ωο,Τ) for afr-oriented (with c-axis perpendicular to the film) õ÷ÁÇóÉÚï?..^ film on a single crystal SrTiCb substrate obtained by far-infrared ellipsometry. The temperature behavior of ÅÁØ(Ï>Ï, Τ) qualitatively conforms to that predicted by the model of the strong electron-phonon interaction. At our frequency we did not observe any peaks below Τ<7ž