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| VOLUME 98 (2013) | ISSUE 2 | PAGE 131 |
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Finite-size effect in shot noise in hopping conduction
E. S. Tikhonov+*, V. S. Khrapai+*, D. V. Shovkun+, D. Schuh×
+Institute of Solid State Physics of the RAS, 142432 Chernogolovka, Russia *Moscow Institute of Physics and Technology, 141700 Dolgoprudny, Russia ×Institute of Applied and Experimental Physics, University of Regensburg, D-93040 Regensburg, Germany
Abstract
We study a current shot noise in a macroscopic insulator based on a two-dimensional electron system in GaAs in a variable range hopping (VRH) regime. At low temperature and in a sufficiently depleted sample a shot noise close to a full Poissonian value is measured. This suggests an observation of a finite-size effect in shot noise in the VRH conduction and demonstrates a possibility of accurate quasiparticle charge measurements in the insulating regime. |