Optically controlled fine-tuning phase shift cell based on thin-film Ge2Sb2Te5 for light beam phase modulation
A. V. Kiselev, A. A. Nevzorov, A. A. Burtsev, V. A. Mikhalevsky, N. N. Eliseev, V. V. Ionin, A. A. Lotin
National Research Centre "Kurchatov Institute", 140700 Shatura, Russia
Abstract
Presented the experimental study of free-space optical control of the optical beam phase
shift caused by the formation of a layered structure in an elementary controllable cell made of
phase-change material Ge2Sb2Te5 subjected to the controlling effect of pulsed laser
radiation. The phase change of the signal optical beam passing through the controlled cell from
phase-change material relative to the control beam in the Jamin interferometer is demonstrated.